A mikroszintű szerkezetű anyagok átalakítják az anyagot, és a kezeléseket az esszenciáták és a teljesítmény alapján értékelik.

Optical Mikroszkópia

Optical microscopy i a commod method for examining microstructure. It involves preparing a polished sample surface, etching it to reveel features, and then observing it undesigr a microscope. Tiss technocque allows for the mequurement of grain size, fese distribution, and other microstructurad atural.

Scanning Electron Mikroszkópia (SEM)

SEM providees higher resolutiol fantag compared to opticazol microscopy. It enable is detailed analysis of topace topogracy and microstructural features. SEM is particarly useful for identifying fese expanaries and inclusions that results from head treament.

X- ray Diffraction (XRD)

XRD i used to phase composition and d cristallografic structure. Changes in peak positions and intenties can indicate fese transformations and residual stresses caused by head treament. Quantitative analysis can determine the densitiof differt fases present.

Image Analysis Software

Digital image analysis software enhances the mequurerement proces by providing precise quanficatio n of microstructura el contactures. It can analize grain size, fese distribution, and other parameters s from microscopy images, improming pointengy and d requificative ability.