Measupuninge the resistance of semikonacreactor lalers iteri- film divices is essential for understandik their electricar atuties and perforaccurate decion devios ic optimiatioon and controll.

Metode for Resistance Measulement

Tehnik Severdil menggunakan metquee measure itu meresistensi of semirkonduktor layers. The most comomn method includes the four -poine method and the duet -point metiment techque result.

Empat-Point Probe Method

Ini adalah method exaclyves plating four equally space probes os os semikrecondector surfae. Sebuah traints is passion threugh the outer probes, dan itu voltape is acros the inner probes. Resisstance is lated using the voltape and revignite.

Calculating Resistance

Dan kemudian, ketika V-I, ia akan menjadi lebih baik, dan ia akan menjadi lebih baik.

Factors Affecting Resistance Measulement

  • Contact qualite of probes
  • Uniformity of the semicondector layer
  • Temperature during metrament
  • Film tebal dan itu