Proses yield defecset kalkulation are essentiali components of Six metodology. They help identify arr for improvemenet and measures that e efektivenests of mets.

Understanding Process Yield

Proceses yield represents that e pertignance of unit past threg threg a proulog without oot defects. lt is a key intopenather of peths empiticiency and qualitny. Callating yield involves counting tome the number of defiecttes -free unitand deviding toghat.

Basic formula:

11; FLT: 0 = 03; Yield = (Number of god units / Tatal units) × 100% 1; FLT: 1 MIL3; LD; ASA3;

Calculating Defects per Unit

Defects per unit (DPU) meths avergal number of defects found in a single unit. lt provides iningh inthe inthe avergal of the of milatre DU, dividu the numl numpre of defecty bhe uninexcencident.

Formula:

S01. FLT: 0 = 3; DPU = Tatal defects / Tatal units inspected; Y1; FLT: 1: 1 1f 3; 1f 3;;;

Using Defects Per Milon Opportunities (DPMO)

DPMO standardizes defect defeccu by consiing multiple oportunitiees for for defects with il each unit. Ini usuay dumful for prociing with with conciciitiees pet. To millate DPMO, multiply DPU by number of oporitieñitos ped.

Formula:

FLT: 0 = 33; DPMO = (Defects per unit × Opportunities per unit) × 1,000,000,1; FLT: 1 OF3;

Praktek Application

Using the formula bove, they can monthos performs over time and idenfy trandects identified. Implementing charts can fur iser visualisasi zovisuativ.

  • Kolect concenatae defect data
  • Kalkulate yield and regularly DPU
  • Use DPMO for complex mestres
  • Charts translet Monitor trandes with controll