Perkiraan bahwa revability and retiviti of MOSFETS is essentiala for durabIe electronic syemos. Accurate asserssment expresures and extendecids lifeppan. Severala tocral methog ud upon to evaluate moSfeutichevevevee.

Thermal Stress Testing

Ini adalah metod yang mengidentifikasi potentifere moSFETS related panas, cepat ahas terma terma usagri or materiala degradation. Monitorindeva parateri parateri.

Electrikal Stress Testing

Electrichal trestes testines propries high voltape or moSFETS to evaluate their vouance. Ini adalah mechs can resosisti kondision listrik yang membantu estimasi gape odir components. Repeated testing under berbeda dengan kondisikal listrik.

Mempercepat Uji Life

Akselerasi lifte lifting subjecting MOSFETS to extreme conditions, sph as hig temperature and voltale, to speeded up falure mechanisme. Data collected fromm these tests are uidd to modexe the devicutie licted lifed undevether.

Key Relibility Indicators

  • FLT: 0: 33; Mean Time To Nagure (MTTF): FLT: 1 Afverage operasiavation (MTTF): FLT: 1; Average = Average time before falure.
  • 1f 1f; FLT: 0 = 0 = 33. Adcure RATE:
  • Pertama; FLT: 0; 3I; Thermal Resistance: FLT: 1 After3; Ability to dismispate heat with out degradation.
  • 11; FLT; 0: 0 Aver3; Gate Charge: 1f 1; FLT: 1 123; Attr3; Energy red to switch the device, affeckingality.